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P.442190 Measurement setup for determining temperature-induced image drift.
Application date: 2022.09.02.

P.442191 Suspension of a photosensitive matrix and a method for repeatable control and compensation of temperature-induced image drift of the photosensitive matrix.
Application date:2022.09.02.

Extension of application
P.441291 under the PCT (Patent Cooperation Treaty) to the countries: Germany, USA, Japan, India, the Netherlands. PCT/IB2023/058662, application published under the number: WO/2024/047599.